PRISMS students at FIBSEM meeting at NIST

A group of PRISMS students (Howard, Lucia, Angel, Gavin) participated in the 10th Annual FIB SEM Workshop, which was held at the National Institute of Standards and Technology (NIST) on March 2nd of 2017.

Presenters from various fields discussed advances in modern electron microscopy and focused ion beam technology. It is interesting to note that about every second presentation included information about the use of modern data visualization and analysis tools, in some cases including machine learning.

Gavin Li presented a poster highlighting the progress of his collaborative project, which involves Focused Ion Beam experiments and the use of data science for analysis of images (Automating Reconstruction of Focused Ion Beam Current Density Distribution).