This Wednesday(March 30th, 2016) we had a presentation about Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) technologies. Mr. Valery Ray, a specialist in FIB and SEM from Advanced Imaging and Microscopy Lab of Maryland Nanocenter gave a talk for the whole school.
The talk was combined with a demo of an actual SEM presented by Evan Slow from Ångstrom Scientific, Inc.
We thank both of our guests for bringing us the modern view on tools used to see and work on micro- and nano-scale.